“Power Side-Channel Leakage Assessment Framework at Register-Transfer Level” (2022)

AUTHORS:

N. Pundir, J. Park, F. Farahmandi, and M. Tehranipoor

Power side-channel (PSC) attacks received significant attention over the past two decades due to their effectiveness in breaking mathematically strong cryptographic implementations. However, most existing PSC assessment frameworks apply only to post-silicon implementations; this is unfavorable to the industry due to the lack of flexibility in fixing the design and the high cost/time penalty incurred in redoing the entire design cycle. This article presents the register transfer level (RTL)-power analysis tool (PAT) framework to perform a technology-independent PSC assessment of cryptographic (pre- and post-quantum) hardware at the RTL stage. Performing assessment at the RTL gives designers the utmost flexibility to quickly apply the countermeasures locally. RTL-PAT can also serve as a front-end sign-off framework for PSC leakage, allowing a designer to make changes in the early design stage, which would otherwise be difficult/time-consuming to perform in subsequent design stages. Furthermore, RTL-PAT can analyze both FPGA and ASIC design flows for standalone IPs and SoCs. In this article, we present the efficacy of RTL-PAT on several cryptographic implementations. The results are presented for standalone IPs, which include different AES implementations (Galois field, lookup table, pipelined, and threshold implementation) and PRESENT cipher. We also analyze a large-scale SoC, which includes the post-quantum SABER implementation and AES. The results show that the framework effectively identifies the leaky modules and validates the efficacy of PSC countermeasures implemented in the RTL. The obtained RTL-PAT assessment results are validated with the post-silicon t -statistics assessment as well.